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Authors:
Ammer, Michael Johannes 
Document type:
Dissertation / Thesis 
Title:
A Methodology to Generate Transient Behavioral Models of Complete ICs out of Design Data for ESD and Electrical Stress Simulation on System Level 
Advisor:
Maurer, Linus, Prof. Dr. techn. 
Referee:
Maurer, Linus, Prof. Dr. techn.; Sauter, Martin, Prof. Dr.-Ing.; Deutschmann, Bernd, Prof. Dr. techn. 
Date oral examination:
16.10.2020 
Publication date:
10.12.2020 
Year:
2020 
Pages (Book):
138 
Language:
Englisch 
Subject:
Datenverarbeitungssystem ; Elektrostatische Entladung ; Ausgleichsvorgang ; Integrierte Schaltung ; Robustheit ; Optimierung ; Systemanalyse ; Modell ; Simulation ; Hochschulschrift 
Keywords:
Electrostatic discharge, integrated circuit (IC) modeling, robustness, system analysis and design, system improvement, system-level design, system testing, system validation, systems modeling, systems simulation 
Abstract:
Designing electronic (sub-)systems to be robust against ESD events is still not an easy task and a standard approach is not yet available. Accurate high frequency and high current models of all involved components are necessary to get precise system ESD simulation results, which help to optimize the ESD robustness of (sub-)systems. Often, the most critical devices in this context are ICs. There are typically no adequate IC ESD models available. A lot of requirements exist for such mode...    »
 
DDC notation:
621.395 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik 
Chair:
Maurer, Linus 
Open Access yes or no?:
Ja / Yes