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Authors:
Reichart, Patrick; Moser, Marcus; Greubel, Christoph; Peeper, Katrin; Dollinger, Günther 
Document type:
Zeitschriftenartikel / Journal Article 
Title:
Deuterium microscopy using 17 MeV deuteron-deuteron scattering 
Journal:
Nuclear Instruments and Methods in Physics Research Section B 
Volume:
371 
Year:
2016 
Pages from - to:
178-184 
Language:
Englisch 
Keywords:
Deuteron-deuteron scattering ; Deuterium microscopy ; Plasma wall interactions ; Silicon strip detector ; Coincidence scattering analysis 
Abstract:
Abstract Using 17 MeV deuterons as a micrometer focused primary beam, we performed deuterium microscopy by using the deuteron-deuteron (dd) scattering reaction. We describe our new box like detector setup consisting of four double sided silicon strip detectors (DSSSD) with 16 strips on each side, each covering up to 0.5 sr solid angle for coincidence detection. This method becomes a valuable tool for studies of hydrogen incorporation or dynamic processes using deuterium tagging. The background f...    »
 
ISSN:
0168-583X 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther 
Open Access yes or no?:
Nein / No