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Authors:
Krause-Rehberg, Reinhard; Bondarenko, Vladimir; Redmann, F.; Borner, F.; Feick, H.; Weber, Eicke R.; Da Via, C.; Egger, Werner; Kögel, Gottfried; Sperr, Peter; Triftshäuser, Werner 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Study of radiation defects in semiconductors by means of positron annihilation 
Title of conference publication:
Proceedings of the 3rd international Symposium on Material Chemistry in Nuclear Environment (Materials Chemistry MC’02) 
Volume:
36 
Issue:
50 
Conference title:
International Symposium on Material Chemistry in Nuclear Environment (3., 2002, Chiba) 
Venue:
Japan Atomic Energy Research Inst., Kashiwa, Chiba (Japan) 
Year of conference:
2002 
Date of conference beginning:
13.03.2002 
Date of conference ending:
15.03.2002 
Year:
2003 
Pages from - to:
114-117 
Language:
Englisch 
Keywords:
Semiconductors, Radiation Defects, Neutron Irradiation, Getter Zones, Silicon, Rp/2 effect 
Abstract:
In a nuclear environment, a strong degradation of important properties is observed for many materials which are otherwise very reliable. This is especially valid for silicon, the most important semiconductor. In the presented paper, two examples for the study of lattice defects in silicon by means of positron annihilation will be given. Firstly, the degradation of silicon detectors used for the particle detection in high-luminosity collider experiments starts to limit the lifetime of the whole e...    »
 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther 
Open Access yes or no?:
Nein / No