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Document type:
Zeitschriftenartikel / Journal Article
Title:
Study of defects in implanted silica glass by depth profiling Positron Annihilation Spectroscopy
Journal:
Nuclear Instruments and Methods in Physics Research Section B
Volume:
268
Issue:
19
Year:
2010
Pages from - to:
3186-3190
Language:
Englisch
Abstract:
Positron Annihilation Spectroscopy (PAS) performed with continuous and pulsed positron beams allows to characterize the size of the intrinsic nano-voids in silica glass, their in depth modification after ion implantation and their decoration by implanted ions. Three complementary PAS techniques, lifetime spectroscopy (LS), Doppler broadening spectroscopy (DBS) and coincidence Doppler broadening spectroscopy (CDBS) will be illustrated by presenting, as a case study, measurements obtained on virgi... »
ISSN:
0168-583X
Department:
Fakultät für Luft- und Raumfahrttechnik
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik
Chair:
Dollinger, Günther
Open Access yes or no?:
Nein / No
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