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Document type:
Konferenzbeitrag / Conference Paper
Title:
Simulation and experimental study of temperature distribution during ESD stress in smart-power technology ESD protection structures
Title of conference publication:
38th Annual 2000 IEEE International Reliability Physics Symposium Proceedings
Conference title:
Annual IEEE International Reliability Physics Symposium (38., 2000, San Jose, CA)
Conference title:
IRPS 2000
Venue:
San Jose, CA
Year of conference:
2000
Date of conference beginning:
10.04.2000
Date of conference ending:
13.04.2000
Publisher:
IEEE
Year:
2000
Pages from - to:
304 – 309
Language:
Englisch
ISBN:
0-7803-5860-0
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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