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Document type:
Konferenzbeitrag / Conference Paper
Title:
Thermal distribution during destructive pulses in ESD protection devices using a single-shot, two-dimensional interferometric method
Title of conference publication:
Digest. International Electron Devices Meeting
Subtitle of conference publication:
8-11 Dec. 2002
Conference title:
International Electron Devices Meeting (2002, San Francisco, CA)
Conference title:
IEDM 2002
Venue:
San Francisco, CA
Year of conference:
2002
Date of conference beginning:
08.12.2002
Date of conference ending:
11.12.2002
Place of publication:
Piscataway
Publisher:
IEEE
Year:
2002
Pages from - to:
345-348
Language:
Englisch
ISBN:
0-7803-7462-2
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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