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Authors:
Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Chip-Level Verification of Complex Mixed-Signal ICs regarding ESD-Stress 
Title of conference publication:
5th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO) 
Subtitle of conference publication:
München, 28.-30.11. 2005 
Conference title:
International Workshop on Electromagnetic Compatibility of Integrated Circuits (5., 2005, München) 
Venue:
München 
Year of conference:
2005 
Date of conference beginning:
28.11.2005 
Date of conference ending:
30.11.2005 
Year:
2005 
Language:
Englisch 
Department:
Fakultät für Elektrotechnik und Technische Informatik 
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik 
Chair:
Groos, Gerhard 
Open Access yes or no?:
Nein / No