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Document type:
Konferenzbeitrag / Conference Paper
Title:
Characterisation method for chip card ESD events causing terminal failures
Title of conference publication:
23rd European Symposium on Reliability of Electronic Devices, Failure Physics and Analysis (ESREF) 2012
Subtitle of conference publication:
1-5 October 2012: Cagliari, Italy
Conference title:
European Symposium on Reliability of Electronic Devices, Failure Physics and Analysis (23., 2012, Cagliari)
Venue:
Cagliari, Italy
Year of conference:
2012
Date of conference beginning:
01.10.2012
Date of conference ending:
05.10.2012
Year:
2012
Language:
Englisch
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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