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Document type:
Konferenzbeitrag / Conference Paper
Title:
Radiation Hardness Testing of Super-Junction Power Mosfets by Heavy Ion Induced SEE Mapping
Title of conference publication:
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Conference title:
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (2018, Singapore)
Venue:
Singapore
Year of conference:
2018
Date of conference beginning:
16.07.2018
Date of conference ending:
19.07.2018
Place of publication:
Piscataway, NJ
Publisher:
IEEE
Year:
2018
Language:
Englisch
ISBN:
978-1-5386-4929-9 ; 978-1-5386-4930-5
Department:
Fakultät für Luft- und Raumfahrttechnik
Institute:
LRT 2 - Institut für Angewandte Physik und Messtechnik
Chair:
Dollinger, Günther
Open Access yes or no?:
Nein / No
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