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Authors:
Campbell, Kelly M.; Schein, Jochen; Dewald, Eduard; Turner, Robert; Landen, Otto; Glenzer, Siegfried 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
NIF Dante Soft X-Ray Diagnostic Fielding and Analysis 
Title of conference publication:
IEEE Conference Record - Abstracts 
Subtitle of conference publication:
2005 IEEE International Conference on Plasma Science 
Conference title:
IEEE International Conference on Plasma Science (2005, Monterey, Calif.) 
Venue:
Monterey, Calif., USA 
Year of conference:
2005 
Date of conference beginning:
20.06.2005 
Date of conference ending:
23.06.2005 
Place of publication:
Piscataway, NJ 
Publisher:
IEEE 
Year:
2005 
Pages from - to:
159 
Language:
Englisch 
ISBN:
0-7803-9300-7 
Open Access yes or no?:
Nein / No