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Authors:
Rudan, Masssimo; Reggiani, Susanna; Gnani, Elena; Baccarani, Giorgio; Corvasce, Chiara; Barlini, Davide; Ciappa, Mauro; Fichtner, Wolfgang; Denison, Marie; Jensen, Nils; Groos, Gerhard; Stecher, Matthias 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Experimental validation of a new analytical model for the position-dependent Hall voltage in semiconductor devices 
Title of conference publication:
Proceedings of 35th European Solid-State Device Research Conference, 2005 
Subtitle of conference publication:
ESSDERC 2005 
Conference title:
European Solid-State Device Research Conference (35., 2005, Grenoble) 
Conference title:
35th ESSDERC 
Venue:
Grenoble, France 
Year of conference:
2005 
Date of conference beginning:
16.09.2005 
Place of publication:
Piscataway 
Publisher:
IEEE 
Year:
2005 
Pages from - to:
565-568 
Language:
Englisch 
ISBN:
0-7803-9203-5 
ISSN:
1930-8876 ; 2378-6558 
Department:
Fakultät für Elektrotechnik und Technische Informatik 
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik 
Chair:
Groos, Gerhard 
Open Access yes or no?:
Nein / No