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Document type:
Konferenzbeitrag / Conference Paper
Title:
Experimental investigation on carrier dynamics at the thermal breakdown
Title of conference publication:
International Conference on Physics of Semiconductor (ICPS), Wien: 24. - 28.07.2006
Subtitle of conference publication:
Book of Abstracts
Conference title:
International Conference on Physics of Semiconductor (2006, Wien)
Venue:
Wien
Year of conference:
2006
Date of conference beginning:
24.07.2006
Date of conference ending:
28.07.2006
Year:
2006
Pages from - to:
366 – 367
Language:
Englisch
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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