Login
Document type:
Konferenzbeitrag / Conference Paper
Title:
Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability
Title of conference publication:
2019 IEEE International Reliability Physics Symposium (IRPS)
Conference title:
Annual IEEE International Reliability Physics Symposium (2019, Monterey, CA)
Venue:
Monterey, CA
Year of conference:
2019
Date of conference beginning:
31.03.2019
Date of conference ending:
04.04.2019
Year:
2019
Language:
Englisch
ISBN:
978-1-5386-9504-3 ; 978-1-5386-9505-0
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 2 - Institut für Physik
Chair:
Hansch, Walter
Open Access yes or no?:
Nein / No
BibTeX