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Autoren:
Rao, Vaishnavi; Matthiesen, Maik; Goetz, Katelyn; Huck, Christian; Yim, Chanyoung; Siris, Rita; Han, Jie; Hahn, Sebastian; Bunz, Uwe; Dreuw, Andreas; Duesberg, Georg; Pucci, Annemarie; Zaumseil, Jana 
Dokumenttyp:
Zeitschriftenartikel / Journal Article 
Titel:
AFM-IR and IR-SNOM for the Characterization of Small Molecule Organic Semiconductors 
Zeitschrift:
The Journal of Physical Chemistry C 
Jahrgang:
124 
Heftnummer:
Jahr:
2020 
Seiten von - bis:
5331-5344 
Sprache:
Englisch 
Abstract:
Vibrational spectroscopies, such as Raman and Fourier-transform infrared spectroscopy (FT-IR), are powerful tools for the characterization of organic semiconductor thin films and crystals in addition to X-ray diffraction and scanning atomic force microscopy. They enable the investigation of molecular orientation, polymorphism, doping levels, and intra- as well as intermolecular vibrational modes albeit without much spatial resolution. Two fundamentally different scanning probe techniques offer t...    »
 
Fakultät:
Fakultät für Elektrotechnik und Informationstechnik 
Institut:
EIT 2 - Institut für Physik 
Professur:
Düsberg, Georg 
Open Access ja oder nein?:
Nein / No