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Document type:
Konferenzbeitrag / Conference Paper
Title:
Application Example of a Novel Methodology to Generate IC Models for System ESD and Electrical Stress Simulation out of the Design Data
Title of conference publication:
41st Annual EOS/ESD Symposium (EOS/ESD)
Conference title:
Annual Electrical Overstress/Electrostatic Discharge Symposium (41., 2019, Riverside, CA)
Venue:
Riverside, CA, USA
Year of conference:
2019
Date of conference beginning:
15.09.2019
Date of conference ending:
20.09.2019
Place of publication:
Piscataway, NJ
Publisher:
IEEE
Year:
2019
Language:
Englisch
ISBN:
978-1-58537-311-6 ; 978-1-7281-2890-0
ISSN:
0739-5159
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
Chair:
Maurer, Linus
Open Access yes or no?:
Nein / No
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