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Document type:
Konferenzbeitrag / Conference Paper
Title:
Correlation limits between capacitively coupled transmission line pulsing (CC-TLP) and CDM for a large chip-on-flex assembly
Title of conference publication:
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
Conference title:
Electrical Overstress/Electrostatic Discharge Symposium (39., 2017, Tucson, AZ)
Venue:
Tucson, AZ, USA
Year of conference:
2017
Date of conference beginning:
10.09.2017
Date of conference ending:
14.09.2017
Publishing institution:
IEEE
Year:
2017
Pages from - to:
1-7
Language:
Englisch
Abstract:
For the first time this correlation study compares air discharge CDM and contact-mode Capacitively Coupled Transmission Line Pulsing (CC-TLP) for a large chip-on-flex assembly e.g. for the Internet of Things (IOT) applications. Both ground planes overlap only part of the flexible substrate with long traces. Correlation can be established according to impulse energy and multi-zap wear-out effects rather than peak current. Circuit simulation supports the experiment. A new scanning method yields th... »
ISBN:
978-1-58537-293-5
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
Chair:
Maurer, Linus
Open Access yes or no?:
Ja / Yes
BibTeX