Universität der Bundeswehr München: AtheneForschung
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Authors:
Weber, Johannes; Kaschani, Karim T.; Gieser, Horst; Wolf, Heinrich; Maurer, Linus; Famulok, Nicolai; Moser, Reinhard; Rajagopal, Krishna; Sellmayer, Michael; Sharma, Anmol; Tamm, Heiko 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Correlation study of different CDM testers and CC-TLP 
Conference title:
Electrical Overstress/Electrostatic Discharge Symposium (39., 2017, Tucson, AZ) 
Conference title:
39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) 
Venue:
Tucson, AZ, USA 
Year of conference:
2017 
Date of conference beginning:
10.09.2017 
Date of conference ending:
14.09.2017 
Publishing institution:
IEEE 
Year:
2017 
Pages from - to:
1-10 
Language:
Englisch 
Abstract:
This paper analyzes the correlation between test results of three different CDM testers and corresponding results of Capacitively Coupled Transmission Line Pulsing (CC-TLP). Furthermore, it discusses the significance of the current slew rate as an additional failure threshold and the reasons for a poor reproducibility of CDM failures. 
ISBN:
978-1-58537-293-5 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik 
Chair:
Maurer, Linus 
Open Access yes or no?:
Ja / Yes 
 BibTeX