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Authors:
Wicpalek, Christian; Mayer, Thomas; Maurer, Linus; Vollenbruch, Ulrich; Liu, Yue; Springer, Andreas 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator 
Collection title:
IEEE/MTT-S International Microwave Symposium, 2007 
Organizer (entity):
Institute of Electrical and Electronics Engineers 
Conference title:
IEEE MTT-S International Microwave Symposium (2007, Honolulu, HI) 
Venue:
Honululu, Hawaii 
Year of conference:
2007 
Date of conference beginning:
03.06.2007 
Date of conference ending:
08.06.2007 
Year:
2007 
Pages from - to:
2205-2208 
Language:
Englisch 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik 
Chair:
Maurer, Linus