Recent investigations on the reconstruction of defect profiles from data obtained by pulsed positron beams
Zeitschrift:
Materials Science Forum
Heftnummer:
255-257
Jahr:
1997
Seiten von - bis:
243-247
Sprache:
Englisch
Abstract:
A general procedure is presented for the systematic determination of the microscopic defect structure from lifetime measurements with pulsed positron beams. The proposed procedure is based on exact relations with full regard of counting statistics. Initially, a deterministic search for characteristic features of the depth profile is performed in the correlation matrix of the experimental data. On this basis the entire problem is decomposed into a set of small subproblems which can be handled by well established iterative search methods. «
A general procedure is presented for the systematic determination of the microscopic defect structure from lifetime measurements with pulsed positron beams. The proposed procedure is based on exact relations with full regard of counting statistics. Initially, a deterministic search for characteristic features of the depth profile is performed in the correlation matrix of the experimental data. On this basis the entire problem is decomposed into a set of small subproblems which can be handled by... »