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Dokumenttyp:
Zeitschriftenartikel / Journal Article
Titel:
Study of defects in implanted silica glass by depth profiling Positron Annihilation Spectroscopy
Zeitschrift:
Nuclear Instruments and Methods in Physics Research Section B
Jahrgang:
268
Heftnummer:
19
Jahr:
2010
Seiten von - bis:
3186-3190
Sprache:
Englisch
Abstract:
Positron Annihilation Spectroscopy (PAS) performed with continuous and pulsed positron beams allows to characterize the size of the intrinsic nano-voids in silica glass, their in depth modification after ion implantation and their decoration by implanted ions. Three complementary PAS techniques, lifetime spectroscopy (LS), Doppler broadening spectroscopy (DBS) and coincidence Doppler broadening spectroscopy (CDBS) will be illustrated by presenting, as a case study, measurements obtained on virgi... »
ISSN:
0168-583X
Fakultät:
Fakultät für Luft- und Raumfahrttechnik
Institut:
LRT 2 - Institut für angewandte Physik und Messtechnik
Professur:
Dollinger, Günther
Open Access ja oder nein?:
Nein / No
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