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Authors:
Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Algorithm for the automatic verification of complex mixed-signal ICs regarding ESD-stress 
Title of conference publication:
2005 PhD Research in Microelectronics and Electronics 
Conference title:
Research in Microelectronics and Electronics (2005, Lausanna) 
Conference title:
PRIME 2005 
Venue:
Lausanne 
Year of conference:
2005 
Date of conference beginning:
25.07.2005 
Date of conference ending:
28.07.2005 
Year:
2005 
Pages from - to:
213-216 
Language:
Englisch 
ISBN:
0-7803-9345-7 
Department:
Fakultät für Elektrotechnik und Technische Informatik 
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik 
Chair:
Groos, Gerhard 
Open Access yes or no?:
Nein / No