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Authors:
Kanzow, Jörn; Faupel, Franz; Egger, Werner; Sperr, Peter; Kögel, Gottfried; Wehlack, C.; Meiser, A.; Possart, Wulff 
Document type:
Sammelbandbeitrag / Paper in Collective Volume 
Title:
Depth-Resolved Analysis of the Aging Behavior of Epoxy Thin Films by Positron Spectroscopy 
Collection title:
Adhesion 
Collection subtitle:
Current Research and Applications 
Collection editors:
Possart, Wulff 
Place of publication:
Weinheim 
Publisher:
Wiley-VCH 
Year:
2006 
Pages from - to:
465-477 
Language:
Englisch 
Keywords:
adhesion ; research ; application ; depth-resolved analysis ; aging behavior of epoxy thin films ; positron spectroscopy ; PALS investigation 
Abstract:
During recent decades positron annihilation spectroscopy has become a very powerful tool for the investigation of polymers. In particular, positron annihilation lifetime spectroscopy (PALS) yields valuable information about free volume and related properties. Moreover, special chemical information can be obtained. Now advances in positron beam technology also allow investigations of thin polymer films and surface regions. In this paper, we report the use, for the first time, of PALS to elucidate...    »
 
ISBN:
3-527-31263-3 ; 978-3-527-31263-4 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther