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Authors:
Thomas, S. L.; Schmidt, K. M.; von Oertzen, Timo 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Identifying compromised test items using the Rasch model and support vector machines 
Conference title:
International Objective Measurement Workshop (2016, Washington, DC) 
Venue:
Washington D.C. 
Year of conference:
2016 
Year:
2016 
Language:
Englisch 
Department:
Fakultät für Humanwissenschaften 
Institute:
Department für Psychologie 
Chair:
von Oertzen, Timo 
Open Access yes or no?:
Nein / No